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Mastering Test Points on Android: The Road to Device Customization and Repair!

Understanding And Function Test Point Android Smartphone

Understanding And Function Test Point Android Smartphone

The understanding of the test point android smartphone and its function in the field of repairing the phone is used to repair the damaged android phone in the IC flash section.

The repair can be done by hard test point or soft test point method depending on the type and brand of the android smartphone being repaired, the level of damage IC flash corrupt and the level of security lock loader of the flash IC itself.

For a tool that can be used to do test points on mobile hardware is quite simple, but the level of difficulty, concentration, and precision is very high.

In the world of electronics Test Point is a gate or point that has a vital function as a single track or point as a tester as well as a protection key for the overall performance of the module or digital electronic device.

With the test point method, engineers will be more effective in finding the problem point of a module, device, especially in digital electronics.

Test Point is hidden and not easy to find because of its vital nature aka important unless there is indeed a datasheet, it will probably be easier to find.

How to perform the test point android smartphone

In mobile electronic devices, the test point has almost the same basic understanding in the electronic module, but in the field of mobile phone repair, there are 2 types of test points namely hard test point and also soft test point. A more complete explanation can be seen below:

The difference between hard test point & soft test point android smartphone

  • Hard test point: It is a hard method of pressing certain hardware, paths, or pins, can be by creating jumper points or by cutting paths at certain points, the main goal is to pass through boot core protection.
  • Soft test point: Performing trigger tests using an algorithm embedded in a program whose function is to lock access to boot core changes or checksum loader IC flash or EEPROM, this test point has the same purpose as the hard test point but is usually used on IC BGA / microchip whose foot IC / BGA pin is closed with protective glue, so it is not possible to perform hard test points.

From the above explanation you may start to understand what is a test point especially on an android smartphone, and here are the special tools and equipment needed to do the test point normally.

Supporting tools to be able to do test point android smartphone

For hard test point methods Cables, clamps, and needles (For now some several methods and tools can be used). Use a small cable/ jumper cable that you can grab from the buzzer speaker cog to get into the gap if possible without a needle.

To do a soft test point, all it takes is a software to match the phone that is being repaired, with a flasher box or with another flashing application.

Test Point is one way to repair your phone in the event of a hard brick or boot loop. This test point is usually often combined with the use of Box flasher, such as the current example UFI box used to repair the IC eMMC smartphone where in this flasher box has been given a place where you can test point on the existing socket.

The test point has a high risk considering its function and placement in a very vital area in a digital module. Therefore considering the basic functions and concepts of this very vital test point, it is advisable to have a fairly mature basic and have sufficient datasheet.

Such a brief explanation that Mobilintec Team can give about the understanding of the test point android smartphone and also how to implement it along with supporting tools to perform the test point method found on the PCB mainboard of the phone.